|
Twitter
|
Facebook
|
Google+
|
VKontakte
|
LinkedIn
|
Viadeo
|
English
|
Français
|
Español
|
العربية
|
 
International Journal of Innovation and Applied Studies
ISSN: 2028-9324     CODEN: IJIABO     OCLC Number: 828807274     ZDB-ID: 2703985-7
 
 
Wednesday 11 December 2019

About IJIAS

News

Submission

Downloads

Archives

Custom Search

Contact

Connect with IJIAS

  Now IJIAS is indexed in EBSCO, ResearchGate, ProQuest, Chemical Abstracts Service, Index Copernicus, IET Inspec Direct, Ulrichs Web, Google Scholar, CAS Abstracts, J-Gate, UDL Library, CiteSeerX, WorldCat, Scirus, Research Bible and getCited, etc.  
 
 
 

Characterization of the refractive index of isotropic materials by three-detector microwave ellipsometry


Volume 26, Issue 4, July 2019, Pages 1097–1107

 Characterization of the refractive index of isotropic materials by three-detector microwave ellipsometry

A. I. H. Gogo1, B. Bayard2, A. Moungache3, and F. GAMBOU4

1 Department of Industrial and Maintenance Engineering, University of Mongo, Mongo, Chad
2 Laboratoire Hubert Curien, Jean Monnet University, Saint-Etienne, France
3 Department of Technology, University of Ndjamena, Ndjamena, Chad
4 Department of Technology, University of Ndjamena, Ndjamena, Chad

Original language: English

Received 19 December 2018

Copyright © 2019 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract


A three-detector microwave ellipsometer is an experimental free-space bench for characterization of non-transparent materials. It is a non-destructive characterization technic working in oblique transmission in the frequencies range of 26 to 30 GHz. A vector network analyzer (VNA) is used as microwave source. The method is based on the determination of complex diagonal tensor which requires the measurement of the sample transmission coefficients. Calibration of the network vector analyzer is needed in order to correct the values of this coefficients due to the measurement errors. The aim of this paper is to show that One Path Two Ports calibration method is convenient for this technic.

Author Keywords: Microwave, ellipsometry, free space method, isotropic materials, calibration.


How to Cite this Article


A. I. H. Gogo, B. Bayard, A. Moungache, and F. GAMBOU, “Characterization of the refractive index of isotropic materials by three-detector microwave ellipsometry,” International Journal of Innovation and Applied Studies, vol. 26, no. 4, pp. 1097–1107, July 2019.