Volume 48, Issue 1, March 2026, Pages 57–63
D.A. Oumar1, M.I. Boukhari2, N.I. Mariam3, S. Capraro4, and J. J. Rousseau5
1 Department of Industrial Engineering and Maintenance, Polytechnical University of Mongo, Mongo, Chad
2 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
3 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
4 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
5 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
Original language: English
Copyright © 2026 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The characterization of planar components such as inductors in an important step in better to understand components behavior as a function of frequency. To do this, it is essential to use a dedicated measuring device and an innovative and appropriate characterization method to achieve good accuracy. In this article, we present a new method and techniques for characterizing Zij impedance and Yij admittance parameters of passive components (resistors, capacitors and inductors) using a WK6500B impedancemeter. Obtained results are very encouraging, with good accuracy of less than 1%.
Author Keywords: Zij and Yij parameters, WK 6500B impedancemeter, integrated passives components.
D.A. Oumar1, M.I. Boukhari2, N.I. Mariam3, S. Capraro4, and J. J. Rousseau5
1 Department of Industrial Engineering and Maintenance, Polytechnical University of Mongo, Mongo, Chad
2 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
3 Laboratoire de Recherche en Electronique, Electrotechnique et Energie (LR3E), National Institute of Sciences and Technologies of Abéché, Abéché, Chad
4 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
5 LabHC UMR 5516, CNRS, 42023 Saint-Etienne, JEAN MONNET University of Saint-Etienne, Saint-Etienne, France
Original language: English
Copyright © 2026 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract
The characterization of planar components such as inductors in an important step in better to understand components behavior as a function of frequency. To do this, it is essential to use a dedicated measuring device and an innovative and appropriate characterization method to achieve good accuracy. In this article, we present a new method and techniques for characterizing Zij impedance and Yij admittance parameters of passive components (resistors, capacitors and inductors) using a WK6500B impedancemeter. Obtained results are very encouraging, with good accuracy of less than 1%.
Author Keywords: Zij and Yij parameters, WK 6500B impedancemeter, integrated passives components.
How to Cite this Article
D.A. Oumar, M.I. Boukhari, N.I. Mariam, S. Capraro, and J. J. Rousseau, “Accuracy determination of Zij and Yij parameters of integrated passive components using WK6500B impedancemeter,” International Journal of Innovation and Applied Studies, vol. 48, no. 1, pp. 57–63, March 2026.
