Volume 6, Issue 3, July 2014, Pages 392–399
Grishma Bhatt1, Praveenlal E.V2, Rachana Rajpal3, and Shyamal Pampattiwar4
1 Electronics and Communication Department, Sal Institute of Technology and Engineering Research, Ahmedabad, Gujarat, India
2 Electronics & Instrumentation Department, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat, India
3 Electronics & Instrumentation Department, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat, India
4 Electronics and Communication Department, Sal Institute of Technology and Engineering Research, Ahmedabad, Gujarat, India
Original language: English
Copyright © 2014 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
A new design of Microcotroller-TMS320F28335 based control card is being design and developed. This card is used to control and monitor the parameters of the analog signal conditioning cards which are used to measure the different plasma characteristic of the upcoming globally challenging and competitive Tokamak, SST-1 in the Institute for Plasma Research.
The characteristics of the long time plasma may change in a large dynamic range and the number of diagnostic channels are in more than two hundreds, so the remote controlling of some parameters of the signal conditioning electronics such as amplifier gain, automatic testing is very essential. The existing card, which is based on 8 bit architecture with very limited features. This necessitates the need of new design with more advanced features to accommodate all required features. The details of this new design will be described in this paper.
Author Keywords: TMS320F28335 (Digital signal controller), CAN(Controller area network) protocol, LabVIEW, PWM.
Grishma Bhatt1, Praveenlal E.V2, Rachana Rajpal3, and Shyamal Pampattiwar4
1 Electronics and Communication Department, Sal Institute of Technology and Engineering Research, Ahmedabad, Gujarat, India
2 Electronics & Instrumentation Department, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat, India
3 Electronics & Instrumentation Department, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat, India
4 Electronics and Communication Department, Sal Institute of Technology and Engineering Research, Ahmedabad, Gujarat, India
Original language: English
Copyright © 2014 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract
A new design of Microcotroller-TMS320F28335 based control card is being design and developed. This card is used to control and monitor the parameters of the analog signal conditioning cards which are used to measure the different plasma characteristic of the upcoming globally challenging and competitive Tokamak, SST-1 in the Institute for Plasma Research.
The characteristics of the long time plasma may change in a large dynamic range and the number of diagnostic channels are in more than two hundreds, so the remote controlling of some parameters of the signal conditioning electronics such as amplifier gain, automatic testing is very essential. The existing card, which is based on 8 bit architecture with very limited features. This necessitates the need of new design with more advanced features to accommodate all required features. The details of this new design will be described in this paper.
Author Keywords: TMS320F28335 (Digital signal controller), CAN(Controller area network) protocol, LabVIEW, PWM.
How to Cite this Article
Grishma Bhatt, Praveenlal E.V, Rachana Rajpal, and Shyamal Pampattiwar, “Design and development of slot-0 controller for EM-diagnostics,” International Journal of Innovation and Applied Studies, vol. 6, no. 3, pp. 392–399, July 2014.
