Volume 26, Issue 4, July 2019, Pages 1097–1107
A. I. H. Gogo1, B. Bayard2, A. Moungache3, and F. GAMBOU4
1 Department of Industrial and Maintenance Engineering, University of Mongo, Mongo, Chad
2 Laboratoire Hubert Curien, Jean Monnet University, Saint-Etienne, France
3 Department of Technology, University of Ndjamena, Ndjamena, Chad
4 Department of Technology, University of Ndjamena, Ndjamena, Chad
Original language: English
Copyright © 2019 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
A three-detector microwave ellipsometer is an experimental free-space bench for characterization of non-transparent materials. It is a non-destructive characterization technic working in oblique transmission in the frequencies range of 26 to 30 GHz. A vector network analyzer (VNA) is used as microwave source. The method is based on the determination of complex diagonal tensor which requires the measurement of the sample transmission coefficients. Calibration of the network vector analyzer is needed in order to correct the values of this coefficients due to the measurement errors. The aim of this paper is to show that One Path Two Ports calibration method is convenient for this technic.
Author Keywords: Microwave, ellipsometry, free space method, isotropic materials, calibration.
A. I. H. Gogo1, B. Bayard2, A. Moungache3, and F. GAMBOU4
1 Department of Industrial and Maintenance Engineering, University of Mongo, Mongo, Chad
2 Laboratoire Hubert Curien, Jean Monnet University, Saint-Etienne, France
3 Department of Technology, University of Ndjamena, Ndjamena, Chad
4 Department of Technology, University of Ndjamena, Ndjamena, Chad
Original language: English
Copyright © 2019 ISSR Journals. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract
A three-detector microwave ellipsometer is an experimental free-space bench for characterization of non-transparent materials. It is a non-destructive characterization technic working in oblique transmission in the frequencies range of 26 to 30 GHz. A vector network analyzer (VNA) is used as microwave source. The method is based on the determination of complex diagonal tensor which requires the measurement of the sample transmission coefficients. Calibration of the network vector analyzer is needed in order to correct the values of this coefficients due to the measurement errors. The aim of this paper is to show that One Path Two Ports calibration method is convenient for this technic.
Author Keywords: Microwave, ellipsometry, free space method, isotropic materials, calibration.
How to Cite this Article
A. I. H. Gogo, B. Bayard, A. Moungache, and F. GAMBOU, “Characterization of the refractive index of isotropic materials by three-detector microwave ellipsometry,” International Journal of Innovation and Applied Studies, vol. 26, no. 4, pp. 1097–1107, July 2019.
